Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 193-198, IEEE Computer Society, 2008. [doi]
@inproceedings{BahukudumbiC08,
title = {Test-Pattern Ordering for Wafer-Level Test-During-Burn-In},
author = {Sudarshan Bahukudumbi and Krishnendu Chakrabarty},
year = {2008},
doi = {10.1109/VTS.2008.28},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.28},
tags = {testing},
researchr = {https://researchr.org/publication/BahukudumbiC08},
cites = {0},
citedby = {0},
pages = {193-198},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}