Xiwei Bai, Jie Tan, Xuelei Wang. Fault Diagnosis and Knowledge Extraction Using Fast Logical Analysis of Data with Multiple Rules Discovery Ability. In Zhongzhi Shi, Cyriel Pennartz, Tiejun Huang, editors, Intelligence Science II - Third IFIP TC12 International Conference, ICIS 2018, Beijing, China, November 2-5, 2018, Proceedings. Volume 539 of IFIP Advances in Information and Communication Technology, pages 412-421, Springer, 2018. [doi]
Abstract is missing.