Xiaying Bai, Wenxian Zheng, Wenming Yang, Guijin Wang, Qingmin Liao. Hard Samples Based Margin Loss for Face Verification. In IEEE International Conference on Image Processing, ICIP 2023, Kuala Lumpur, Malaysia, October 8-11, 2023. pages 3513-3517, IEEE, 2023. [doi]
Abstract is missing.