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EYESEE: A machine vision system for inspection of integrated circuit chips

Michael L. Baird. EYESEE: A machine vision system for inspection of integrated circuit chips. In Proceedings of the 1985 IEEE International Conference on Robotics and Automation, St. Louis, Missouri, USA, March 25-28, 1985. pages 444-448, IEEE, 1985. [doi]

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Michael L. Baird

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