P. N. Bajeel, M. Kumar. Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring. In Debasis Giri, Rajkumar Buyya, S. Ponnusamy, Debashis De, Andrew Adamatzky, Jemal H. Abawajy, editors, Proceedings of the Sixth International Conference on Mathematics and Computing - ICMC 2020, Gangtok, Sikkim, India, September 2020. Volume 1262 of Advances in Intelligent Systems and Computing, pages 483-490, Springer, 2020. [doi]
Abstract is missing.