Effect of process variations in CMOS chips for radar beamforming

Elias Bakken, Tor Sverre Lande, Sverre Holm. Effect of process variations in CMOS chips for radar beamforming. In NORCHIP 2012, Copenhagen, Denmark, November 12-13, 2012. pages 1-4, IEEE, 2012. [doi]

Authors

Elias Bakken

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Tor Sverre Lande

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Sverre Holm

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