Dhrumeel Bakshi, Michael S. Hsiao. LFSR seed computation and reduction using SMT-based fault-chaining. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1071-1076, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
@inproceedings{BakshiH13,
title = {LFSR seed computation and reduction using SMT-based fault-chaining},
author = {Dhrumeel Bakshi and Michael S. Hsiao},
year = {2013},
url = {http://dl.acm.org/citation.cfm?id=2485549},
researchr = {https://researchr.org/publication/BakshiH13},
cites = {0},
citedby = {0},
pages = {1071-1076},
booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
editor = {Enrico Macii},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
isbn = {978-1-4503-2153-2},
}