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Correlation of logical failures to a suspect process step

Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith. Correlation of logical failures to a suspect process step. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 458-476, IEEE Computer Society, 1999.

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