Kedarnath J. Balakrishnan. Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 345-350, IEEE Computer Society, 2007. [doi]
@inproceedings{Balakrishnan07:0,
title = {Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding},
author = {Kedarnath J. Balakrishnan},
year = {2007},
doi = {10.1109/VLSID.2007.71},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2007.71},
tags = {rule-based},
researchr = {https://researchr.org/publication/Balakrishnan07%3A0},
cites = {0},
citedby = {0},
pages = {345-350},
booktitle = {20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}