Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes - researchr publication

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Narayanaswamy Balakrishnan 0001, Elena Castilla, María Jaenada, Leandro Pardo. Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes. Quality and Reliability Eng. Int., 39(4):1192-1222, June 2023. [doi]

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