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Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution

Narayanaswamy Balakrishnan 0001, Elena Castilla, Nirian Martín, Leandro Pardo. Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution. IEEE Transactions on Information Theory, 65(5):3080-3096, 2019. [doi]

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