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Understanding the impact of gate-level physical reliability effects on whole program execution

Raghuraman Balasubramanian, Karthikeyan Sankaralingam. Understanding the impact of gate-level physical reliability effects on whole program execution. In 20th IEEE International Symposium on High Performance Computer Architecture, HPCA 2014, Orlando, FL, USA, February 15-19, 2014. pages 60-71, IEEE, 2014. [doi]

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Raghuraman Balasubramanian

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Karthikeyan Sankaralingam

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