S. Balatsouka, V. Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty. Defect aware X-filling for low-power scan testing. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 873-878, IEEE, 2010. [doi]
@inproceedings{BalatsoukaTKC10,
title = {Defect aware X-filling for low-power scan testing},
author = {S. Balatsouka and V. Tenentes and Xrysovalantis Kavousianos and Krishnendu Chakrabarty},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5456928},
tags = {testing, context-aware},
researchr = {https://researchr.org/publication/BalatsoukaTKC10},
cites = {0},
citedby = {0},
pages = {873-878},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}