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Gianpiero Balboni, Gianpiero Cabodi, Silvano Gai, D. Sismondi, Matteo Sonza Reorda. A parallel system for test pattern generation. In Proceedings of the Third IEEE Symposium on Parallel and Distributed Processing, SPDP 1991, 2-5 December 1991, Dallas, Texas, USA. pages 708-715, IEEE Computer Society, 1991. [doi]

This author has not been identified. Look up 'Gianpiero Balboni' in GoogleThis author has not been identified. Look up 'Gianpiero Cabodi' in GoogleThis author has not been identified. Look up 'Silvano Gai' in GoogleThis author has not been identified. Look up 'D. Sismondi' in GoogleThis author has not been identified. Look up 'Matteo Sonza Reorda' in Google

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