A parallel system for test pattern generation

Gianpiero Balboni, Gianpiero Cabodi, Silvano Gai, D. Sismondi, Matteo Sonza Reorda. A parallel system for test pattern generation. In Proceedings of the Third IEEE Symposium on Parallel and Distributed Processing, SPDP 1991, 2-5 December 1991, Dallas, Texas, USA. pages 708-715, IEEE Computer Society, 1991. [doi]

Abstract

Abstract is missing.