Jiri Balcarek, Petr Fiser, Jan Schmidt. Techniques for SAT-Based Constrained Test Pattern Generation. In 14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2011, August 31 - September 2, 2011, Oulu, Finland. pages 360-366, IEEE, 2011. [doi]
@inproceedings{BalcarekFS11,
title = {Techniques for SAT-Based Constrained Test Pattern Generation},
author = {Jiri Balcarek and Petr Fiser and Jan Schmidt},
year = {2011},
doi = {10.1109/DSD.2011.50},
url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2011.50},
researchr = {https://researchr.org/publication/BalcarekFS11},
cites = {0},
citedby = {0},
pages = {360-366},
booktitle = {14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2011, August 31 - September 2, 2011, Oulu, Finland},
publisher = {IEEE},
isbn = {978-1-4577-1048-3},
}