Jiri Balcarek, Petr Fiser, Jan Schmidt. Techniques for SAT-Based Constrained Test Pattern Generation. In 14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2011, August 31 - September 2, 2011, Oulu, Finland. pages 360-366, IEEE, 2011. [doi]
Abstract is missing.