Radj A. Baldewsing, Johannes A. Schaar, Frits Mastik, Cees. W. J. Oomens, Anton F. W. van der Steen. Assessment of vulnerable plaque composition by matching the deformation of a parametric plaque model to measured plaque deformation. IEEE Trans. Med. Imaging, 24(4):514-528, 2005. [doi]
Abstract is missing.