Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability

M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten. Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Microelectronics Reliability, 88:1108-1112, 2018. [doi]

Abstract

Abstract is missing.