Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices - researchr publication authors

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Sajid Baloch, Tughrul Arslan, Adrian Stoica. Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 330-345, IEEE Computer Society, 2006. [doi]

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