Moez Balti, Abdelaziz Samet, Daniel Pasquet, Emmanuelle Bourdel. Noise Modeling Including Effect of propagation along the gate of a field-effect transistor. In 12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005. pages 1-4, IEEE, 2005. [doi]
@inproceedings{BaltiSPB05,
title = {Noise Modeling Including Effect of propagation along the gate of a field-effect transistor},
author = {Moez Balti and Abdelaziz Samet and Daniel Pasquet and Emmanuelle Bourdel},
year = {2005},
doi = {10.1109/ICECS.2005.4633408},
url = {http://dx.doi.org/10.1109/ICECS.2005.4633408},
researchr = {https://researchr.org/publication/BaltiSPB05},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005},
publisher = {IEEE},
isbn = {978-9972-61-100-1},
}