Julen Balzategui, Luka Eciolaza, Nestor Arana-Arexolaleiba, Jon Altube, Jean-Philippe Aguerre, Iñaki Legarda-Ereño, Aitor Apraiz. Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks. In 24th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2019, Zaragoza, Spain, September 10-13, 2019. pages 529-535, IEEE, 2019. [doi]
Abstract is missing.