Daisuke Bamba, Minoru Watanabe, Nobuya Watanabe. Total-Ionizing-Dose Tolerance Analysis of a Radiation-Hardened Image Sensor. In IEEE International Conference on Consumer Electronics, ICCE 2023, Las Vegas, NV, USA, January 6-8, 2023. pages 1-2, IEEE, 2023. [doi]
Abstract is missing.