Majid Banaeyan, Darshan Batavia, Walter G. Kropatsch. Removing Redundancies in Binary Images. In Akram Bennour, Tolga Ensari, Yousri Kessentini, Sean Eom, editors, Intelligent Systems and Pattern Recognition - Second International Conference, ISPR 2022, Hammamet, Tunisia, March 24-26, 2022, Revised Selected Papers. Volume 1589 of Communications in Computer and Information Science, pages 221-233, Springer, 2022. [doi]
Abstract is missing.