Analytical prediction formula of random variation in high frequency performance of weak inversion scaled MOSFET - researchr publication authors

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Rawid Banchuin, Roungsan Chaisricharoen. Analytical prediction formula of random variation in high frequency performance of weak inversion scaled MOSFET. In Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA 2014, Chiang Mai, Thailand, December 9-12, 2014. pages 1-6, IEEE, 2014. [doi]

This author has not been identified. Look up 'Rawid Banchuin' in GoogleThis author has not been identified. Look up 'Roungsan Chaisricharoen' in Google

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