Rawid Banchuin, Roungsan Chaisricharoen. Analytical prediction formula of random variation in high frequency performance of weak inversion scaled MOSFET. In Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA 2014, Chiang Mai, Thailand, December 9-12, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.