Ansuman Banerjee, Shayak Chakraborty, Sourav Chakraborty 0001, Kuldeep S. Meel, Uddalok Sarkar, Sayantan Sen. Testing of Horn Samplers. In Francisco J. R. Ruiz, Jennifer G. Dy, Jan-Willem van de Meent, editors, International Conference on Artificial Intelligence and Statistics, 25-27 April 2023, Palau de Congressos, Valencia, Spain. Volume 206 of Proceedings of Machine Learning Research, pages 1301-1330, PMLR, 2023. [doi]
Abstract is missing.