Subho S. Banerjee, James Cyriac, Saurabh Jha, Zbigniew T. Kalbarczyk, Ravishankar K. Iyer. Towards a Bayesian Approach for Assessing Fault Tolerance of Deep Neural Networks. In 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019, Supplemental Volume. pages 25-26, IEEE, 2019. [doi]
@inproceedings{BanerjeeCJKI19,
title = {Towards a Bayesian Approach for Assessing Fault Tolerance of Deep Neural Networks},
author = {Subho S. Banerjee and James Cyriac and Saurabh Jha and Zbigniew T. Kalbarczyk and Ravishankar K. Iyer},
year = {2019},
doi = {10.1109/DSN-S.2019.00018},
url = {https://doi.org/10.1109/DSN-S.2019.00018},
researchr = {https://researchr.org/publication/BanerjeeCJKI19},
cites = {0},
citedby = {0},
pages = {25-26},
booktitle = {49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019, Supplemental Volume},
publisher = {IEEE},
isbn = {978-1-7281-3028-6},
}