Subho S. Banerjee, James Cyriac, Saurabh Jha, Zbigniew T. Kalbarczyk, Ravishankar K. Iyer. Towards a Bayesian Approach for Assessing Fault Tolerance of Deep Neural Networks. In 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019, Supplemental Volume. pages 25-26, IEEE, 2019. [doi]
Abstract is missing.