Design-for-test methodology for non-scan at-speed testing

Mainak Banga, Nikhil P. Rahagude, Michael S. Hsiao. Design-for-test methodology for non-scan at-speed testing. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 191-196, IEEE, 2011. [doi]

@inproceedings{BangaRH11,
  title = {Design-for-test methodology for non-scan at-speed testing},
  author = {Mainak Banga and Nikhil P. Rahagude and Michael S. Hsiao},
  year = {2011},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763041},
  researchr = {https://researchr.org/publication/BangaRH11},
  cites = {0},
  citedby = {0},
  pages = {191-196},
  booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
  publisher = {IEEE},
  isbn = {978-1-61284-208-0},
}