Ankita Bansal, Abha Jain. Analysis of Focussed Under-Sampling Techniques with Machine Learning Classifiers. In 19th IEEE/ACIS International Conference on Software Engineering Research, Management and Applications, SERA 2021, Kanazawa, Japan, June 20-22, 2021. pages 91-96, IEEE, 2021. [doi]
@inproceedings{BansalJ21,
title = {Analysis of Focussed Under-Sampling Techniques with Machine Learning Classifiers},
author = {Ankita Bansal and Abha Jain},
year = {2021},
doi = {10.1109/SERA51205.2021.9509270},
url = {https://doi.org/10.1109/SERA51205.2021.9509270},
researchr = {https://researchr.org/publication/BansalJ21},
cites = {0},
citedby = {0},
pages = {91-96},
booktitle = {19th IEEE/ACIS International Conference on Software Engineering Research, Management and Applications, SERA 2021, Kanazawa, Japan, June 20-22, 2021},
publisher = {IEEE},
isbn = {978-1-7281-7677-2},
}