Ankita Bansal, Abha Jain. Analysis of Focussed Under-Sampling Techniques with Machine Learning Classifiers. In 19th IEEE/ACIS International Conference on Software Engineering Research, Management and Applications, SERA 2021, Kanazawa, Japan, June 20-22, 2021. pages 91-96, IEEE, 2021. [doi]
No references recorded for this publication.
No citations of this publication recorded.