On Handling Memory Scan Chains

Surbhi Bansal, Aviansh Mendhalkar, Ramesh C. Tekumalla. On Handling Memory Scan Chains. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 6-10, IEEE, 2014. [doi]

Authors

Surbhi Bansal

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Aviansh Mendhalkar

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Ramesh C. Tekumalla

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