Surbhi Bansal, Aviansh Mendhalkar, Ramesh C. Tekumalla. On Handling Memory Scan Chains. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 6-10, IEEE, 2014. [doi]
@inproceedings{BansalMT14, title = {On Handling Memory Scan Chains}, author = {Surbhi Bansal and Aviansh Mendhalkar and Ramesh C. Tekumalla}, year = {2014}, doi = {10.1109/NATW.2014.11}, url = {http://dx.doi.org/10.1109/NATW.2014.11}, researchr = {https://researchr.org/publication/BansalMT14}, cites = {0}, citedby = {0}, pages = {6-10}, booktitle = {IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014}, publisher = {IEEE}, }