Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das. Yield estimation of SRAM circuits using Virtual SRAM Fab . In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 631-636, IEEE, 2009. [doi]
@inproceedings{BansalSKMLASKCNHD09,
title = {Yield estimation of SRAM circuits using Virtual SRAM Fab },
author = {Aditya Bansal and Rama N. Singh and Rouwaida Kanj and Saibal Mukhopadhyay and Jin-fuw Lee and Emrah Acar and Amith Singhee and Keunwoo Kim and Ching-Te Chuang and Sani R. Nassif and Fook-Luen Heng and Koushik K. Das},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5361230},
researchr = {https://researchr.org/publication/BansalSKMLASKCNHD09},
cites = {0},
citedby = {0},
pages = {631-636},
booktitle = {2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA},
publisher = {IEEE},
}