Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor. Critical Fault-Based Pattern Generation for Screening SDDs. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 177-182, IEEE Computer Society, 2011. [doi]
Abstract is missing.