Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning

Wenxia Bao, Jian Zhao, Gensheng Hu, Dongyan Zhang, Linsheng Huang, Dong Liang 0009. Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning. SUSCOM, 30:100526, 2021. [doi]

Abstract

Abstract is missing.