A self optimizing autofocusing scheme for microscope integrated visual inspection systems

Eray A. Baran, Orhan Ayit, Victor B. Santiago, Sergio Lopez-Doriga, Asif Sabanovic. A self optimizing autofocusing scheme for microscope integrated visual inspection systems. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 4043-4048, IEEE, 2013. [doi]

@inproceedings{BaranASLS13,
  title = {A self optimizing autofocusing scheme for microscope integrated visual inspection systems},
  author = {Eray A. Baran and Orhan Ayit and Victor B. Santiago and Sergio Lopez-Doriga and Asif Sabanovic},
  year = {2013},
  doi = {10.1109/IECON.2013.6699783},
  url = {https://doi.org/10.1109/IECON.2013.6699783},
  researchr = {https://researchr.org/publication/BaranASLS13},
  cites = {0},
  citedby = {0},
  pages = {4043-4048},
  booktitle = {IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013},
  publisher = {IEEE},
}