Aaditya Baranwal, Abdul Mueez, Jason Voelker, Guneet Bhatia, Shruti Vyas. SynSpill: Improved Industrial Spill Detection with Synthetic Data. In IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Workshops, Honolulu, HI, USA, October 19-20, 2025. pages 1425-1434, IEEE, 2025. [doi]
@inproceedings{BaranwalMVBV25,
title = {SynSpill: Improved Industrial Spill Detection with Synthetic Data},
author = {Aaditya Baranwal and Abdul Mueez and Jason Voelker and Guneet Bhatia and Shruti Vyas},
year = {2025},
doi = {10.1109/ICCVW69036.2025.00152},
url = {https://doi.org/10.1109/ICCVW69036.2025.00152},
researchr = {https://researchr.org/publication/BaranwalMVBV25},
cites = {0},
citedby = {0},
pages = {1425-1434},
booktitle = {IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Workshops, Honolulu, HI, USA, October 19-20, 2025},
publisher = {IEEE},
isbn = {979-8-3315-8988-2},
}