SynSpill: Improved Industrial Spill Detection with Synthetic Data

Aaditya Baranwal, Abdul Mueez, Jason Voelker, Guneet Bhatia, Shruti Vyas. SynSpill: Improved Industrial Spill Detection with Synthetic Data. In IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Workshops, Honolulu, HI, USA, October 19-20, 2025. pages 1425-1434, IEEE, 2025. [doi]

Abstract

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