Riccardo Barbano, Chen Zhang, Simon R. Arridge, Bangti Jin. Quantifying Model Uncertainty in Inverse Problems via Bayesian Deep Gradient Descent. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 1392-1399, IEEE, 2020. [doi]
Abstract is missing.