Management of Critical Areas and Defectivity Data for Yield Trend Modeling - researchr publication authors

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Sandrine Barberan, Frederic Duvivier. Management of Critical Areas and Defectivity Data for Yield Trend Modeling. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 17, IEEE Computer Society, 1998. [doi]

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