Sandrine Barberan, Frederic Duvivier. Management of Critical Areas and Defectivity Data for Yield Trend Modeling. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 17, IEEE Computer Society, 1998. [doi]
@inproceedings{BarberanD98,
title = {Management of Critical Areas and Defectivity Data for Yield Trend Modeling},
author = {Sandrine Barberan and Frederic Duvivier},
year = {1998},
url = {http://computer.org/proceedings/dft/8832/88320017abs.htm},
tags = {modeling, data-flow},
researchr = {https://researchr.org/publication/BarberanD98},
cites = {0},
citedby = {0},
pages = {17},
booktitle = {13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-8832-7},
}