Warley Barbosa, Lucas Amaral, Tiago Vieira, Bruno Georgevich Ferreira, Gustavo Melo. Industrial Visual Defect Inspection of Electronic Components with Siamese Neural Network. In Petia Radeva, Giovanni Maria Farinella, Kadi Bouatouch, editors, Proceedings of the 18th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2023, Volume 4: VISAPP, Lisbon, Portugal, February 19-21, 2023. pages 889-896, SCITEPRESS, 2023. [doi]
Abstract is missing.