Linda M. Barclay, Roderick S. Barclay. Risk Analysis Of Critical Control Points in the Life Cycle of SMF Information. In George W. Dodson, J. William Mullen, Linda J. Carroll, Dave Parker, Carole Arruda Reed, Harry Zimmer, Carolyn Hanna, Doug McBride, Bob Miller, Dave Thorn, Ellen E. Robertson, Bob Bishop, Ellen M. Friedman, Chuck Hopf, Jerry L. Rosenberg, John P. Pilch, editors, 15th International Computer Measurement Group Conference, Reno, Nevada, USA, December 11-15, 1989, Proceedings. pages 1211-1219, Computer Measurement Group, 1989.
@inproceedings{BarclayB89,
title = {Risk Analysis Of Critical Control Points in the Life Cycle of SMF Information},
author = {Linda M. Barclay and Roderick S. Barclay},
year = {1989},
tags = {points-to analysis, analysis, source-to-source, peer-to-peer, open-source},
researchr = {https://researchr.org/publication/BarclayB89},
cites = {0},
citedby = {0},
pages = {1211-1219},
booktitle = {15th International Computer Measurement Group Conference, Reno, Nevada, USA, December 11-15, 1989, Proceedings},
editor = {George W. Dodson and J. William Mullen and Linda J. Carroll and Dave Parker and Carole Arruda Reed and Harry Zimmer and Carolyn Hanna and Doug McBride and Bob Miller and Dave Thorn and Ellen E. Robertson and Bob Bishop and Ellen M. Friedman and Chuck Hopf and Jerry L. Rosenberg and John P. Pilch},
publisher = {Computer Measurement Group},
}