Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation

Alessandro Barenghi, Cédric Hocquet, David Bol, François-Xavier Standaert, Francesco Regazzoni, Israel Koren. Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation. In Ari Juels, Christof Paar, editors, RFID. Security and Privacy - 7th International Workshop, RFIDSec 2011, Amherst, USA, June 26-28, 2011, Revised Selected Papers. Volume 7055 of Lecture Notes in Computer Science, pages 48-60, Springer, 2011. [doi]

Abstract

Abstract is missing.