Martin Barke, Michael Kärgel, Markus Olbrich, Ulf Schlichtmann. Robustness measurement of integrated circuits and its adaptation to aging effects. Microelectronics Reliability, 54(6-7):1058-1065, 2014. [doi]
@article{BarkeKOS14,
title = {Robustness measurement of integrated circuits and its adaptation to aging effects},
author = {Martin Barke and Michael Kärgel and Markus Olbrich and Ulf Schlichtmann},
year = {2014},
doi = {10.1016/j.microrel.2014.01.012},
url = {http://dx.doi.org/10.1016/j.microrel.2014.01.012},
researchr = {https://researchr.org/publication/BarkeKOS14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {6-7},
pages = {1058-1065},
}