Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Martin Barke, Michael Kärgel, Markus Olbrich, Ulf Schlichtmann. Robustness measurement of integrated circuits and its adaptation to aging effects. Microelectronics Reliability, 54(6-7):1058-1065, 2014. [doi]