Martin Barke, Ulf Schlichtmann. A Cross-Layer Approach to Measure the Robustness of Integrated Circuits. JETC, 12(3):24, 2015. [doi]
@article{BarkeS15,
title = {A Cross-Layer Approach to Measure the Robustness of Integrated Circuits},
author = {Martin Barke and Ulf Schlichtmann},
year = {2015},
doi = {10.1145/2743022},
url = {http://doi.acm.org/10.1145/2743022},
researchr = {https://researchr.org/publication/BarkeS15},
cites = {0},
citedby = {0},
journal = {JETC},
volume = {12},
number = {3},
pages = {24},
}