Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Martin Barke, Ulf Schlichtmann. A Cross-Layer Approach to Measure the Robustness of Integrated Circuits. JETC, 12(3):24, 2015. [doi]